Today’s
scientific and engineering research and development mainly lies in
the realm of nanotechnology, such as manipulation, imaging,
fabrication, and application of systems at the nanometer scale. To
maintain the momentum of this nanotechnology-oriented scientific
progression, a significant tool such as global focused ion beam (FIB)
market is needed to successfully combat all the challenges and
fulfill all the promises of the future of nanoscience.
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Focused
ion beam instruments have both micromachining and high-level imaging
capabilities at the nanometer-micrometer scale, and are thus
popularly used in materials science and the semiconductors industry.
They are now increasingly being used in the biological field for
ablation of materials, deposition, and site-specific analysis. While
the broad majority of FIB systems are mostly used for semiconductor
applications, recent years have witnessed a marked increase in the
overall use of FIB tools in the field of materials science.
Focused
Ion Beam System Used as a Leading Materials Science Tool
FIB
systems are a vital tool used for manipulating and operating various
materials and their structures at the nanoscale level. The field of
materials science perpetually seeks imaging and analysis on a minute
scale to gain an in-depth understanding of the materials,
composition, structure, and processing. Such precision and material
fabrication is achieved with the help of FIB systems.
A
focused ion beam system presents imaging capabilities similar to
those of a scanning electron microscope (SEM). FIB systems coupled
with SEM are most commonly used to set up samples for TEM or
transmission electron microscopes. Focused ion beam systems have
become imperative to the progress of materials science and many other
fields that depend on nanotechnology. Hence, the FIB market is
estimated to reach an estimated value of US$4,624 million by 2021,
growing at a CAGR of 7.4% until 2021, reports a leading market firm
in the U.S.
Focused
ion beam microscopy is increasingly being implemented in a wide range
of materials science applications, such as the generation of 3D
visualization, specimen preparation, prototype nanomachining,
microstructural analysis, and circuit editing.
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Fastest
Growing Areas of Application for FIB-SEM
Until
recently, 3D imaging and materials analysis via FIB-SEM was one of
the most basic processes to analyze the structure and composition of
a material. During the past few years, 3D FIB-SEM analysis has been
implemented in many other disciplines such as geology, life sciences,
and fuel cell applications. FIB-SEM also finds use in six other areas
of applications. They are:
Device
Modification
Materials
Science
Circuit
Edit
Failure
Analysis
Nanofabrication
Others
(including biological science)
Among
the aforementioned, the circuit edit application held the largest
share of the FIB market in 2014. Focused ion beam circuit edits help
cut specific traces of materials or add metal connections within a
chip. Circuit edits utilize fine gallium ions to image, etch, and
deposit the materials on integrated circuits.
Advances
in Ion Sources
At
present, most of the focused ion beam instruments are prepared with
liquid metal ion source (LMIS), which emits gallium ions. This is one
of the most significant developments in the field. Gallium ion source
held the largest share in the global FIB market in 2014, accounting
for 39.6% of the market.
Gallium
LMIS FIB technology is currently robust in the global market. It
offers the advantages of a long source lifetime and high mass ions
for rapid machining.
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